Implementing Generic Built-in Self-Test for Testing Kilo-Bit Memories

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dc.contributor.authorGupta, Anuj
dc.contributor.supervisorGupta, Sanjay
dc.contributor.supervisorSingh, Amardeep
dc.date.accessioned2026-02-25T07:54:07Z
dc.date.issued2005-05
dc.identifier.urihttps://hdl.handle.net/10266/7231
dc.language.isoenen_US
dc.subjectKilo-Bit-Memoriesen_US
dc.subjectGeneric Built-in Self-Testen_US
dc.titleImplementing Generic Built-in Self-Test for Testing Kilo-Bit Memoriesen_US
dc.typeThesisen_US

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