Implementing Generic Built-in Self-Test for Testing Kilo-Bit Memories

Thumbnail Image

Files

m92093.pdf (54.6 MB)

Date

2005-05

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Description

Keywords

Kilo-Bit-Memories, Generic Built-in Self-Test

Citation

URI

https://hdl.handle.net/10266/7231

Collections

Masters Theses@ECED

Endorsement

Review

Supplemented By

Referenced By