Soliton Force Microscopy Using Cavity Soliton

dc.contributor.authorKaur, Harleen
dc.contributor.supervisorJana, Soumendu
dc.date.accessioned2017-08-08T10:51:23Z
dc.date.available2017-08-08T10:51:23Z
dc.date.issued2017-08-08
dc.descriptionIts a Master Thesis on cavity soliton that may lead to soliton force microscopyen_US
dc.description.abstractThe movement of cavity soliton (CS) can be regulated by gradients of the system parameter. We studied the generation and dynamics of CS in VCSEL with saturable absorber (SA) and coupled with Frequency Selective Feedback (FSF) for different gradient and fluctuation of the system parameters. Periodic modulation, constant gradient and random fluctuation/gradient have been considered. Gradient modulation driven soliton dynamics for all these cases are presented extensively. The CS dynamics are found sensitive to the gradient. The result suggest that such CS dynamics can be used to scan a material surface as well as bulk any inhomogenities or defects of material can be detected intensively. This make the path for soliton force microscopy.en_US
dc.identifier.urihttp://hdl.handle.net/10266/4594
dc.language.isoenen_US
dc.subjectCavity Solitonen_US
dc.subjectSaturable Absorberen_US
dc.subjectFrequency Selective Feedbacken_US
dc.subjectPerturbationen_US
dc.titleSoliton Force Microscopy Using Cavity Solitonen_US
dc.typeThesisen_US

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