Please use this identifier to cite or link to this item: http://hdl.handle.net/10266/854
Title: Machine Vision Based Examination Evaluation in Thapar University
Authors: Bansal, Shruti
Supervisor: Singh, Mandeep
Keywords: Machine Vision;Optical Mark Recognition;Pattern matching
Issue Date: 10-Aug-2009
Abstract: Optical Mark Recognition (OMR) is the automated process of capturing the data which is in the form of bubbles, squares or tick marks. This technique is widely used in various applications like exam evaluation, automated attendance marking, voting and community surveys etc. Though the technique usually makes use of commercially available dedicated OMR scanners, but it has its own drawbacks. The present work proposes to automate the same using machine vision for exam evaluation. A standardized sheet is designed for conducting any type of exam. Special marks on the sheet ensure the sheet is not skewed or folded. Every mark on the sheet is recognized using the unique alphanumeric character assigned to it. This is done by pattern matching in Machine Vision Assistant 7.1 and LabVIEW 7.1. The accuracy attained by the system for 100 samples is 98.45%.
Description: Master of Engineering in Electronics Instrumentation and Control
URI: http://hdl.handle.net/10266/854
Appears in Collections:Masters Theses@EIED

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